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Optical constants characterization of As30Se70−xSnx thin films using neural networks
ARTICLE

, Thin Films Laboratory, Department of Physics, Faculty of Education, Ain Shams University, Egypt ; , Nano-Science & Semiconductor Laboratories, Department of Physics, Faculty of Education, Ain Shams University, Egypt ; , Theoretical Group, Department of Physics, Faculty of Education, Ain Shams University, Egypt ; , Nano-Science & Semiconductor Laboratories, Department of Physics, Faculty of Education, Ain Shams University, Egypt ; , Theoretical Group, Department of Physics, Faculty of Education, Ain Shams University, Egypt

Journal of Applied Research and Technology Volume 15, Number 5, ISSN 1665-6423 Publisher: Elsevier Ltd

Abstract

This paper uses an artificial neural network (ANN) and resilient back-propagation (Rprop) training algorithm to determine the optical constants of As

Citation

Attia, A.A., El-Bana, M.S., Habashy, D.M., Fouad, S.S. & El-Bakry, M.Y. (2017). Optical constants characterization of As30Se70−xSnx thin films using neural networks. Journal of Applied Research and Technology, 15(5), 423-429. Elsevier Ltd. Retrieved March 28, 2024 from .

This record was imported from Journal of Applied Research and Technology on January 29, 2019. Journal of Applied Research and Technology is a publication of Elsevier.

Full text is availabe on Science Direct: http://dx.doi.org/10.1016/j.jart.2017.03.009

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