Optical constants characterization of As30Se70−xSnx thin films using neural networks
ARTICLE
Attia A. Attia, Thin Films Laboratory, Department of Physics, Faculty of Education, Ain Shams University, Egypt ; Mohammed S. El-Bana, Nano-Science & Semiconductor Laboratories, Department of Physics, Faculty of Education, Ain Shams University, Egypt ; Doaa M. Habashy, Theoretical Group, Department of Physics, Faculty of Education, Ain Shams University, Egypt ; Suzan S. Fouad, Nano-Science & Semiconductor Laboratories, Department of Physics, Faculty of Education, Ain Shams University, Egypt ; Mahmoud Y. El-Bakry, Theoretical Group, Department of Physics, Faculty of Education, Ain Shams University, Egypt
Journal of Applied Research and Technology Volume 15, Number 5, ISSN 1665-6423 Publisher: Elsevier Ltd
Abstract
This paper uses an artificial neural network (ANN) and resilient back-propagation (Rprop) training algorithm to determine the optical constants of As
Citation
Attia, A.A., El-Bana, M.S., Habashy, D.M., Fouad, S.S. & El-Bakry, M.Y. (2017). Optical constants characterization of As30Se70−xSnx thin films using neural networks. Journal of Applied Research and Technology, 15(5), 423-429. Elsevier Ltd. Retrieved March 28, 2024 from https://www.learntechlib.org/p/198188/.
This record was imported from Journal of Applied Research and Technology on January 29, 2019. Journal of Applied Research and Technology is a publication of Elsevier.
Full text is availabe on Science Direct: http://dx.doi.org/10.1016/j.jart.2017.03.009